A scanning electron microscopy study of Taxus leaves as related to taxonomy

Scanning Microscopy

Volumn 10, Issue 4, 1996, Pages 1111-1126

  Strobel, G A ^a   Hess, W M ^b  

^a MONTANA STATE UNIVERSITY   (United States)

^b BRIGHAM YOUNG UNIVERSITY   (United States)

Author keywords

Epicuticular wax; Scanning electron microscopy; Taxol; Yew geography; Yew leaves; Yew species; Yew taxonomy

Indexed keywords

ANTINEOPLASTIC AGENT; PACLITAXEL;

ARTICLE; BOTANY; MICROSCOPY; NONHUMAN; PLANT LEAF; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SPECIES DIFFERENTIATION; TAXONOMY; TREE;

MICROSCOPY, ELECTRON, SCANNING; PACLITAXEL; PLANT LEAVES; SPECIES SPECIFICITY; TREES; WAXES;

TAXUS;

EID: 0030561772     PISSN: 08917035     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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