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Volumn 70, Issue 1, 1996, Pages 83-89
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The relationship between the resistance of a membrane patch and predicted changes in total patch circuit resistance secondary to spontaneous or induced alterations in patch geometry
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Author keywords
cell attached patch clamp recording; membrane resistance; membrane vesicle; seal resistance; series resistance; single channel events; single channel recording
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Indexed keywords
ANIMAL CELL;
ARTICLE;
CELL CULTURE;
CONTROLLED STUDY;
INTRACELLULAR RECORDING;
MELANOMA CELL;
MEMBRANE RESISTANCE;
MOUSE;
NONHUMAN;
PATCH CLAMP;
PRIORITY JOURNAL;
ANIMALS;
EQUIPMENT DESIGN;
MELANOMA, EXPERIMENTAL;
MEMBRANE POTENTIALS;
MICE;
MODELS, THEORETICAL;
PATCH-CLAMP TECHNIQUES;
TUMOR CELLS, CULTURED;
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EID: 0030561095
PISSN: 01650270
EISSN: None
Source Type: Journal
DOI: 10.1016/S0165-0270(96)00106-9 Document Type: Article |
Times cited : (1)
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References (5)
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