Single electron tunneling effect in YBCO films

Journal of the Korean Physical Society

Volumn 29, Issue 3, 1996, Pages 354-359

  Kye, J I ^a   Park, W K ^a   Kim, B I ^a   Khim, Z G ^a   Jeong, G T ^b   Lee, D H ^b   Shim, T E ^b   Lee, J G ^b  

^a Seoul National University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030557999     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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