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Volumn 65, Issue 3, 1996, Pages 848-852
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High Field ESR of Kagome Antiferromagnets SrCrxGa12-xO19
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Author keywords
Frustration; G value; Kagome antiferromagnet; Linewidth; Randomness; SrCrxGa12_xO19; Submillimeter wave ESR
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Indexed keywords
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EID: 0030556874
PISSN: 00319015
EISSN: None
Source Type: Journal
DOI: 10.1143/JPSJ.65.848 Document Type: Article |
Times cited : (37)
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References (30)
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