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Volumn 34, Issue 1, 1996, Pages 55-61
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The effect of long-correlation-length surface roughness on the ellipsometric parameters of reflected light
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0030554405
PISSN: 02955075
EISSN: None
Source Type: Journal
DOI: 10.1209/epl/i1996-00415-5 Document Type: Article |
Times cited : (14)
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References (21)
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