Current Oscillations Induced by Recombination Instability in Semiconductors

Journal of the Physical Society of Japan

Volumn 65, Issue 5, 1996, Pages 1490-1499

  Oshio, Ken Ichi ^a   Yahata, Hideo ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Chaos; Computer simulation; Field enhanced trapping; Gold doped n Ge, high field domain; Recombination instability

Indexed keywords

EID: 0030546593     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.65.1490     Document Type: Article

References (19)

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