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Volumn 29, Issue 3, 1996, Pages 338-341

Temperature dependence measurement of the magnetic penetration depth of a YBa2Cu3O7 thin film

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0030544508     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (21)
  • 14
    • 18844454067 scopus 로고
    • Ph. D. dissertation, UCLA
    • S. Cho, Ph. D. dissertation, UCLA (1995).
    • (1995)
    • Cho, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.