Determination of the structural parameters of a graded epitaxial layer by methods of high-resolution x-ray diffractometry. I. Initial approximation of the solution of the inverse problem of diffraction

Physics of the Solid State

Volumn 38, Issue 1, 1996, Pages 143-147

  Punegov, V I ^a   Faleev, N N ^a  

^a SYKTYVKAR STATE UNIVERSITY   (Russian Federation)

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EID: 0030537474     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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