Structural analysis of a Mo/Si multilayered X-ray mirror by X-ray diffraction

Journal of the Korean Physical Society

Volumn 29, Issue 1, 1996, Pages 74-78

  Kim, Dong Eon ^a   Cha, Dong Ho ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030536582     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

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