Test of a density-dependent interaction using in-plane 28Si(p→,p→′)28Si polarization transfer measurements

Physical Review C - Nuclear Physics

Volumn 53, Issue 4, 1996, Pages 1711-1717

  Liu, Jian ^a,c   Stephenson, E J ^a   Bacher, A D ^a   Bowyer, S M ^a,d   Chang, S ^a,e   Olmer, C ^a   Wells, S P ^a,f   Wissink, S W ^a   Lisantti, J ^b  

^a INDIANA UNIVERSITY   (United States)

^b CENTENARY COLLEGE OF LOUISIANA   (United States)

^c McDonnell Douglas Tech Serv Co   (United States)

^d PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^e IBM   (United States)

^f MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030535548     PISSN: 05562813     EISSN: 1089490X     Source Type: Journal    
DOI: 10.1103/PhysRevC.53.1711     Document Type: Article

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