The initial growth of Ni atoms deposited on a Cu(001) surface

Journal of the Korean Physical Society

Volumn 29, Issue 3, 1996, Pages 321-326

  Kim, S H ^a,e   Lee, K S ^a   Min, H G ^a   Seo, Jikeun ^b   Hong, S C ^c   Rho, T H ^c   Kim, Jae Sung ^d  

^a Hong Ik University   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

^c University of Ulsan   (South Korea)

^d Sookmyung Women's University   (South Korea)

^e Sungkyunkwan University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030533880     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (17)

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16. The thickness calibration of the AES signals is based on a specific growth mode of the deposited film. However, in this article, the growth mode of the thin film is under investigation, so all the possible growth modes should be examined. For the respective growth mode, the calibration was carried out as described in the following references ; D. Briggs and N. P. Seah, Practical Surface Analysis by Auger and X-ray Photo Electron Spectroscopy (John Wiley, 1990);
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