Refined RBS and AES techniques for the analysis of thin films used in photovoltaic devices

Physica Status Solidi (B) Basic Research

Volumn 194, Issue 1, 1996, Pages 69-78

  Bohne, W ^a   Fenske, F ^a   Kelling, S ^a   Schopke A ^a   Selle, B ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030530055     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.2221940108     Document Type: Article

References (15)

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