High-resolution reflectometry by optical multidigitized coherence

Optical Review

Volumn 3, Issue 1, 1996, Pages 38-46

  Ichimura, Tsutomu ^a   Anndo, Naoki ^a,d   Funaba, Tadayuki ^a   Endo, Shigeru ^a   Odagiri, Yoshiki ^a,d   Tan No, Naohiro ^a   Inaba, Humio ^b,c  

^a YAMAGATA UNIVERSITY   (Japan)

^b TOHOKU INSTITUTE OF TECHNOLOGY   (Japan)

^c Biophotonics Info Laboratories   (Japan)

^d NEC CORPORATION   (Japan)

Author keywords

Laser coherence; Multi mode laser; Optical frequency domain reflectometer; Optical interference measurements; Optical signal processing

Indexed keywords

EID: 0030527442     PISSN: 13406000     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10043-996-0038-1     Document Type: Article

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