Evidence of 3D-XY critical behaviour in La2-xSrxCuO4 films

Europhysics Letters

Volumn 34, Issue 4, 1996, Pages 281-286

  Jaccard, Y ^a,b   Schneider, T ^a   Locquet, J P ^a   Williams, E J ^a,c   Martinoli, P ^b   Fischer, OO ^c  

^a IBM RESEARCH ZURICH   (Switzerland)

^b UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^c UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030525389     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i1996-00451-1     Document Type: Article

References (19)

1. LOBB C. J., Phys. Rev. B, 36 (1987) 3930.
2. KAPITULNIK A. et al., Phys. Rev. B, 37 (1988) 537.
3. FISCHER D. S., FISCHER M. P. and HUSE D. A., Phys. Rev. B, 43 (1991) 130.
4. SCHNEIDER T. and ARIOSA D., Z. Phys. B, 89 (1992) 267.
5. UZUNOV D. I., Theory of Critical Phenomena (World Scientific, Singapore) 1993.
6. KOZLOWSKI A. et al., Physica C, 184 (1991) 113.
7. OVEREND N. et al., Phys. Rev. Lett., 72 (1994) 3238.
8. SCHNEIDER T. and KELLER H., Int. J. Mod. Phys. B, 8 (1993) 487.
9. ZECH D., private communication.
10. KAMAL S., Phys. Rev. Lett., 73 (1994) 1845.
11. JEANNERET B. et al., Appl. Phys. Lett., 55 (1989) 2336.
12. JACCARD Y. et al., Proceedings of the SPIE Conference on Oxide Superconductors and Nano-engineering, SPIE, 2158 (1994) 200.
13. WILLIAMS E. J. et al., EMAG'93, Liverpool, Inst. Phys. Conf. Ser. No. 138 (1993), p. 329, section 7.
14. KAO H. L. et al., Appl. Phys. Lett., 59 (1991) 2748.
15. YI G.-C. et al., Physica C, 194 (1992) 293.
16. WILLIAMS E. J. et al., Proceedings of Microscopy & Microanalysis, edited by G. W. BAILEY et al. (Jones & Begell Publishing, New York, N.Y.) 1995, p. 382.
17. BARBER M. N., in Phase Transitions and Critical Phenomena, edited by C. DOMB and J. L. LEBOWITZ, Vol. 8 (Academic Press. New York, N.Y.) 1983, p. 143.
18. SCHNEIDER T. and SCHMIDT A., J. Phys. Soc. Jpn., 61 (1992) 2169.
19. TALLON J. L. and FLOWERS N. E., Physica C, 204 (1993) 237.