Application of a CdTe solid-state detector to polarization-dependent total-reflection fluorescence XAFs measurements

Journal of Synchrotron Radiation

Volumn 3, Issue 4, 1996, Pages 160-162

  Chun, Wang Jae ^a   Asakura, Kiyotaka ^a   Iwasawa, Yasuhiro ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

CdTe detectors; Molybdenum oxide; Polarization dependent total reflection fluorescence XAFS; Titanium oxide (110)

Indexed keywords

EID: 0030524563     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049596005250     Document Type: Article

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