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Volumn 14, Issue 5, 1996, Pages 2835-2841

Correlation between gas phase composition of rf plasma of argon diluted tetraethylgermanium and chemical structure of therewith deposited Ge/C films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0030522119     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580232     Document Type: Article
Times cited : (17)

References (25)
  • 15


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.