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Volumn 24, Issue 1, 1996, Pages 74-96
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The cut-off phenomenon for random reflections
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Author keywords
Cut off phenomenon; Fourier analysis; Random walk; Reflection
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Indexed keywords
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EID: 0030517925
PISSN: 00911798
EISSN: None
Source Type: Journal
DOI: 10.1214/aop/1042644708 Document Type: Article |
Times cited : (29)
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References (12)
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