Toward development of an ideal X-ray diffractometer sample holder

Powder Diffraction

Volumn 11, Issue 3, 1996, Pages 200-203

  Narasimha Rao, G V ^a   Sastry, V S ^a   Gopala Krishana Murthy, H S ^b   Seshagiri, V ^c   Radhakrishnan, T S ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^b Metkem Silicon Limited   (India)

^c SRI KRISHNADEVARAYA UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON; SILICON WAFERS; X RAY DIFFRACTION ANALYSIS;

BRAGG REFLECTION; DIFFRACTOMETRY; LOW-INTENSITY; POWDER X-RAYS; SAMPLE HOLDERS; SILICON SINGLE CRYSTALS; X RAY DIFFRACTOMETERS;

SINGLE CRYSTALS;

EID: 0030507067     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S088571560000912X     Document Type: Article

References (4)

1. Jenkins, R., Fawcett, T. G., Smith, D. K., Visser, J. W., Morris, M. C., and Frevel, L. K. (1986). Powder Diffr. 1, 51.
2. Li, Chi-Tang, and Albe, William R. (1993). Powder Diffr. 8, 118.
3. Narasimha Rao et al. (to be published).
4. Smith, D. K., and Barrett, C. S. (1978). Adv. X-ray Anal. 22, 1.