메뉴 건너뛰기




Volumn 14, Issue 6, 1996, Pages 3092-3099

Effect of nonstoichiometry upon optical properties of radio frequency sputtered Al-N thin films formed at various sputtering pressures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0030505093     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580177     Document Type: Article
Times cited : (28)

References (24)
  • 17
    • 85033855185 scopus 로고
    • Association of Technological Information of Japan
    • Measurement and Evaluation of Thin Films (Association of Technological Information of Japan, 1991), p. 119.
    • (1991) Measurement and Evaluation of Thin Films , pp. 119


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.