Same particle analysis of suspended particulate matter by electron probe microanalysis and secondary ion mass spectrometry

Bunseki Kagaku

Volumn 45, Issue 6, 1996, Pages 479-484

  Sakamoto, Tetsuo ^a   Tomiyasu, Bunbunoshin ^a   Jingu, Nobuyasu ^b   Owari, Masanori ^c   Nihei, Yoshimasa ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

EPMA; Individual particle analysis; SIMS; Suspended particulate matter

Indexed keywords

EID: 0030500876     PISSN: 05251931     EISSN: None     Source Type: Journal    
DOI: 10.2116/bunsekikagaku.45.479     Document Type: Article

References (8)

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6. T. Sakamoto, B. Tomiyasu, K. Katsumata, N. Jingu, M. Owari, Y. Nihei: "Secondary Ion Mass Spectrometry SIMS X", in press.
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