메뉴 건너뛰기




Volumn 11, Issue 3, 1996, Pages 253-258

Lattice parameters determination from powder diffraction data: Results from a round robin project

Author keywords

Accuracy; Lattice parameters; Potassium chloride; Precision; Round robin

Indexed keywords

DIFFRACTION; LATTICE CONSTANTS; NUMERICAL ANALYSIS; X RAY POWDER DIFFRACTION;

EID: 0030493330     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715600009210     Document Type: Article
Times cited : (12)

References (30)
  • 1
    • 0028449495 scopus 로고
    • The use of the serial-correlations concept in the figure-of-merit function for powder diffraction profile fitting
    • Andreev, Y, G. (1994). "The Use of the Serial-Correlations Concept in the Figure-of-Merit Function for Powder Diffraction Profile Fitting," J. Appl. Cryst. 27, 288-297.
    • (1994) J. Appl. Cryst. , vol.27 , pp. 288-297
    • Andreev, Y.G.1
  • 3
    • 84926111268 scopus 로고
    • A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology
    • Enzo, S., Fagherazzi, G., Benedetti, A., and Polizzi, S. (1988). "A Profile-Fitting Procedure for Analysis of Broadened X-ray Diffraction Peaks. I. Methodology," J. Appl. Cryst. 21, 536-542.
    • (1988) J. Appl. Cryst. , vol.21 , pp. 536-542
    • Enzo, S.1    Fagherazzi, G.2    Benedetti, A.3    Polizzi, S.4
  • 4
    • 84978574037 scopus 로고
    • International union of crystallography, commission on crystallographic apparatus. Single crystal intensity measurement project report II. Least-squares refinements of structural parameters
    • Hamilton, W. C., and Abrahams, S. C., (1970). "International Union of Crystallography, Commission on Crystallographic Apparatus. Single Crystal Intensity Measurement Project Report II. Least-Squares Refinements of Structural Parameters," Acta Cryst. A 26, 18-24.
    • (1970) Acta Cryst. A , vol.26 , pp. 18-24
    • Hamilton, W.C.1    Abrahams, S.C.2
  • 5
    • 0026138991 scopus 로고
    • Lattice parameter determination for powders using synchrotron radiation
    • Hart, M. (1991). "Lattice Parameter Determination for Powders using Synchrotron Radiation," J. Appl. Cryst. 24, 189-190.
    • (1991) J. Appl. Cryst. , vol.24 , pp. 189-190
    • Hart, M.1
  • 6
    • 0038087737 scopus 로고
    • The refractive-index correction in powder diffraction
    • Hart, M., Parrish, W., Bellotto, M., and Lim, G. S. (1988). "The Refractive-Index Correction in Powder Diffraction," Acta Cryst. A 44, 193-197.
    • (1988) Acta Cryst. A , vol.44 , pp. 193-197
    • Hart, M.1    Parrish, W.2    Bellotto, M.3    Lim, G.S.4
  • 7
    • 0001829654 scopus 로고
    • The effect of profile step width on the determination of crystal structure parameters and estimated standard deviations by X-ray rietveld analysis
    • Hill, R. J., and Madsen, I. C. (1986). "The Effect of Profile Step Width on the Determination of Crystal Structure Parameters and Estimated Standard Deviations by X-Ray Rietveld Analysis," J. Appl. Cryst. 19, 10-18.
    • (1986) J. Appl. Cryst. , vol.19 , pp. 10-18
    • Hill, R.J.1    Madsen, I.C.2
  • 9
    • 34547664312 scopus 로고
    • The use of the Durbin-Watson d statistics in rietveld analysis
    • Hill, R. J., and Flack, H. D. (1987). "The use of the Durbin-Watson d Statistics in Rietveld Analysis," J. Appl. Cryst. 20, 356-361.
    • (1987) J. Appl. Cryst. , vol.20 , pp. 356-361
    • Hill, R.J.1    Flack, H.D.2
  • 11
    • 0002056762 scopus 로고
    • Derivation of d values from digitized X-ray and synchrotron diffraction data
    • Huang, T. C., Parrish, W., Masciocchi, N., and Wang, P. W. (1990). "Derivation of d Values from digitized X-Ray and Synchrotron Diffraction Data," Adv. X-Ray Anal. 33, 295-302.
    • (1990) Adv. X-ray Anal. , vol.33 , pp. 295-302
    • Huang, T.C.1    Parrish, W.2    Masciocchi, N.3    Wang, P.W.4
  • 16
    • 85033763344 scopus 로고    scopus 로고
    • Lutterotti L., Maistrelli P., Scardi P., Artioli G., Masciocchi N., Bellotto M., Berti G., Cappuccio G., Chiari G., Massarotti, V., and Zanazzi P. (1993). "XRPD of KCl on Different Diffractometers: Lattice Parameters and Structure Refinement," Proc. 23th Congress of AIC (AIC, Venice, 19-22/10/1993), 104-105; and Plinius 10, 33-34.
    • Plinius , vol.10 , pp. 33-34
  • 17
    • 0021463798 scopus 로고
    • Precise determination of lattice parameter and thermal expansion coefficient for silicon between 300 and 1500 K
    • Okada, Y., and Tokamura, Y. (1984). "Precise determination of lattice parameter and thermal expansion coefficient for silicon between 300 and 1500 K," J. Appl. Phys. 56, 314-320.
    • (1984) J. Appl. Phys. , vol.56 , pp. 314-320
    • Okada, Y.1    Tokamura, Y.2
  • 18
    • 0000573782 scopus 로고
    • Results of the I.U.Cr. precision lattice-parameter project
    • Parrish, W. (1960). "Results of the I.U.Cr. precision lattice-parameter project," Acta Cryst. 13, 838-850.
    • (1960) Acta Cryst. , vol.13 , pp. 838-850
    • Parrish, W.1
  • 19
    • 0001362247 scopus 로고
    • Unit-cell refinement from powder diffraction scans
    • Pawley, G. S. (1981), "Unit-cell Refinement from Powder Diffraction Scans," J. Appl. Cryst. 14, 357-361.
    • (1981) J. Appl. Cryst. , vol.14 , pp. 357-361
    • Pawley, G.S.1
  • 20
    • 0001632607 scopus 로고
    • Line profiles of neutron powder-diffraction peaks for structure refinement
    • Rietveld, H. M. (1967). "Line Profiles of Neutron Powder-Diffraction Peaks for Structure Refinement," Acta Cryst. 22, 151-152.
    • (1967) Acta Cryst. , vol.22 , pp. 151-152
    • Rietveld, H.M.1
  • 21
    • 0002211129 scopus 로고
    • A profile refinement method for nuclear and magnetic structures
    • Rietveld, H. M. (1969). "A profile Refinement Method for Nuclear and Magnetic Structures," J. Appl. Cryst. 2, 65-71.
    • (1969) J. Appl. Cryst. , vol.2 , pp. 65-71
    • Rietveld, H.M.1
  • 22
    • 84974397164 scopus 로고
    • Experimental determination of the instrumental broadening in the Bragg-Brentano geometry
    • Scardi, P., Lutterotti, L., and Maistrelli, P. (1994). "Experimental Determination of the Instrumental Broadening in the Bragg-Brentano Geometry," Powder Diffr. 9, 180-186.
    • (1994) Powder Diffr. , vol.9 , pp. 180-186
    • Scardi, P.1    Lutterotti, L.2    Maistrelli, P.3
  • 24
    • 84927522518 scopus 로고
    • Recommended values for the thermal expansivity of silicon from 0 to 1000 K
    • Swenson, C. A. (1983). "Recommended values for the thermal expansivity of silicon from 0 to 1000 K," J. Phys. Chem., Ref. Data 12, 179-182.
    • (1983) J. Phys. Chem., Ref. Data , vol.12 , pp. 179-182
    • Swenson, C.A.1
  • 27
    • 0000023606 scopus 로고
    • Whole-powder-pattern fitting without reference to a structural model: Application to X-ray powder diffractometer data
    • Toraya, H. (1986). "Whole-Powder-Pattern Fitting without Reference to a structural Model: Application to X-ray Powder Diffractometer Data," J. Appl. Cryst. 19, 440-447.
    • (1986) J. Appl. Cryst. , vol.19 , pp. 440-447
    • Toraya, H.1
  • 28
    • 0000379838 scopus 로고
    • Simultaneous peak-shift correction in the least-squares determination of unit-cell parameters of a sample with standard reference material
    • Toraya, H., and Kitamura, M. (1990). "Simultaneous Peak-Shift Correction in the Least-Squares Determination of Unit-Cell Parameters of a Sample with Standard Reference Material," J. Appl. Cryst. 23, 282-285.
    • (1990) J. Appl. Cryst. , vol.23 , pp. 282-285
    • Toraya, H.1    Kitamura, M.2
  • 29
    • 84974365689 scopus 로고
    • Accurate determination of unit-cell parameters using conventional X-ray powder diffractometry
    • Toraya, H., and Parrish, W. (1992). "Accurate Determination of Unit-Cell Parameters using Conventional X-Ray Powder Diffractometry," Adv. X-Ray Anal. 35, 431-438.
    • (1992) Adv. X-ray Anal. , vol.35 , pp. 431-438
    • Toraya, H.1    Parrish, W.2
  • 30
    • 0027575231 scopus 로고
    • On a small error on SRM 640, SRM 640a and SRM 640b lattice parameters
    • Yoder-Short, Y. (1993). "On a small error on SRM 640, SRM 640a and SRM 640b lattice parameters," J. Appl. Cryst. 26, 272-276.
    • (1993) J. Appl. Cryst. , vol.26 , pp. 272-276
    • Yoder-Short, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.