Secondary ion mass spectrometric studies on the formation mechanism of IrO2/ZrO2 based electrocatalytic thin films

Rapid Communications in Mass Spectrometry

Volumn 10, Issue 15, 1996, Pages 1881-1886

  Daolio, S ^a   Kristof J ^b   Mink, J ^b   De Battisti, A ^c   Mihaly J ^b   Piccirillo, C ^a  

^a CNR   (Italy)

^b UNIVERSITY OF PANNONIA   (Hungary)

^c UNIVERSITY OF FERRARA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; COATINGS; ELECTRODES; PRECIOUS METALS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; THIN FILMS; TITANIUM DIOXIDE; ZIRCONIA;

COATING MIXTURE; ELECTROCATALYTIC; FILM ELECTRODES; FORMATION MECHANISM; ION MASS; SECONDARY ION-MASS SPECTROMETRY; SECONDARY IONS; THIN-FILMS; TITANIA SUPPORTS; ZRO 2 FILMS;

IRIDIUM COMPOUNDS;

EID: 0030479698     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(199612)10:15<1881::AID-RCM766>3.0.CO;2-C     Document Type: Article

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