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Volumn 26, Issue 10, 1996, Pages 1724-1730
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Relative efficiency and reliability of parametric and nonparametric sequential accuracy testing plans
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0030457806
PISSN: 00455067
EISSN: None
Source Type: Journal
DOI: 10.1139/x26-196 Document Type: Article |
Times cited : (2)
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References (0)
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