Teaching application of an X-ray powder diffraction data card file: XRD profile simulation and hanawalt index tabulation

Computers and Geosciences

Volumn 22, Issue 8, 1996, Pages 935-942

  Carbonin, Susanna ^a   Menegazzo, Giorgio ^b  

^a UNIVERSITY OF PADOVA   (Italy)

^b Liceo Scientifico I Nievo   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAM; CRYSTALLINE COMPOUND; HANAWALT INDEX; XRD;

EID: 0030441980     PISSN: 00983004     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0098-3004(96)00048-9     Document Type: Article

References (4)

1. Edmonds, J. W., 1980, Generalization of the Frevel ZRD-SEARCH-MATCH program for powder diffraction analysis: Jour. Applied Crystallography, v. 13, no. 2, p. 191-192.
2. Frevel, L. K., Adams, C. E., and Ruhberg, L. R., 1976, A fast search-match program for powder diffraction analysis: Jour. Applied Crystallography, v. 9, no. 3, p. 199-204.
3. Howard, S. A., and Preston, K. D., 1989, Profile fitting of powder diffraction patterns, in Ribbe, P. H., ed., Reviews in Mineralogy, v. 20: Mineralogical Soc. America, Washington, D.C., p. 217-272.
4. Riello, P., Fagherazzi, G., Clemente, D., and Canton, P., 1995, X-ray Rietveld analysis with a physically based background: Jour. Applied Crystallography, v. 28, no. 2, p. 115-120.