A new method to perform in situ current voltage curves with an electrochemical scanning tunnelling microscope

Ultramicroscopy

Volumn 66, Issue 3-4, 1996, Pages 133-139

  Abadal, G ^a   Perez Murano F ^a   Barniol, N ^a   Borrise X ^a   Aymerich, X ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

Electrochemistry; Instrumentation; Scanning probe microscopy

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTROCHEMISTRY; ELECTROLYTES; POLARIZATION; SEMICONDUCTING SILICON;

BIPOTENTIOSTATIC CONTROL; ELECTROCHEMICAL CURRENTS;

SCANNING TUNNELING MICROSCOPY;

ANALYTIC METHOD; AQUEOUS SOLUTION; ARTICLE; DIAGNOSTIC IMAGING; ELECTROCHEMICAL DETECTION; ELECTROCHEMISTRY; INSTRUMENTATION; POLARIZATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; SPECTROSCOPY;

EID: 0030436340     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00011-9     Document Type: Article

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