High-precision analysis of hydrous rhyolitic glass inclusions in quartz phenocrysts using the electron microprobe and INAA

American Mineralogist

Volumn 81, Issue 9-10, 1996, Pages 1249-1262

  Hanson, Benjamin ^a,b   Delano, John W ^a   Lindstrom, David J ^b  

^a STATE UNIVERSITY OF NEW YORK   (United States)

^b NASA JOHNSON SPACE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON PROBE MICROANALYSIS; GLASS; QUARTZ; STRATIGRAPHY; TRACE ELEMENTS;

ACCURACY AND PRECISION; ANALYTICAL UNCERTAINTY; CHEMICAL COMPOSITIONS; ELECTRON MICROPROBES; INCLUSION COMPOSITION; INSTRUMENTAL NEUTRON ACTIVATIONS; INTERNAL CONSISTENCY; STRATIGRAPHIC CORRELATION;

VOLCANOES;

ELECTRON MICROPROBE; GLASS INCLUSION; INAA; RHYOLITE;

EID: 0030430309     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-1996-9-1023     Document Type: Article

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