Interference effects in inelastic thickness fringes

Ultramicroscopy

Volumn 66, Issue 3-4, 1996, Pages 173-181

  Nelhiebel, M ^a   Schenner, M ^a   Schattschneider, P ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTRON SCATTERING; LIGHT INTERFERENCE; SILICON; THICKNESS MEASUREMENT;

ATOMIC INNER SHELL EXCITATIONS; MONOCRYSTALS;

CRYSTALS;

ARTICLE; CRYSTAL STRUCTURE; ELASTICITY; ELECTRON BEAM; HIGH ENERGY PHOSPHATE; INSTRUMENTATION; NONHUMAN; PHASE CONTRAST MICROSCOPY; RADIATION SCATTERING; THICKNESS;

EID: 0030428510     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00085-X     Document Type: Article

References (16)

1. [1] L. Reimer, Transmission Electron Microscopy (Springer, Berlin, 1989).
2. [2] P. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley and M.J. Whelan, Electron Microscopy of Thin Crystals (Krieger, Huntington, 1977).
3. [3] D.K. Saldin and P. Rez, Philos. Mag. B 55 (1987) 481.
4. [4] L.J. Allen, Ultramicroscopy 48 (1993) 97.
5. [5] A. Weickenmeier and H. Kohl, Philos. Mag. B 60 (1989) 467.
6. [6] S.L. Dudarev, L.-M. Peng and M.J. Whelan, Phys. Rev. B 48 (1993) 13408.
7. [7] L. Reimer, in: Energy-filtering Transmission Electron Microscopy, Ed. L. Reimer (Springer, Berlin, 1994) p. 347.
8. [8] P. Schattschneider, B. Jouffrey and M. Nelhiebel, Phys. Rev. B 54 (1996) 3861.
9. [9] P. Schattschneider, M. Nelhiebel, M. Schenner, W. Grogger and F. Hofer, J. Microscopy 183 (1996) 18.
10. [10] H. Kohl and H. Rose, Adv. Electron. Electron Phys. 65 (1985) 173.
11. [11] R.F. Egerton, Electron Energy-loss Spectroscopy in the Electron Microscope (Plenum Press, New York, 1986).
12. [12] A.G. Wright and D.M. Bird, Acta Crystallogr. A 45 (1989) 342.
13. [13] G.L. Squires, Introduction to the Theory of Thermal Neutron Scattering (Cambridge University Press, Cambridge, 1978).
14. [14] L. Van Hove, Phys. Rev. 95 (1954) 249.
15. [15] M. Schenner, M. Nelhiebel and P. Schattschneider, Ultramicroscopy 65 (1996) 95.
16. [16] G. Radi, Acta Cryst. A 26 (1970) 41.