Genetic algorithm for automatic generation of test logic for digital circuits

Proceedings of the International Conference on Tools with Artificial Intelligence

Volumn , Issue , 1996, Pages 10-16

  Corno, Fulvio ^a   Prinetto, Paolo ^a   Reorda, Matteo Sonza ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; DIGITAL INTEGRATED CIRCUITS; FINITE AUTOMATA; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; LOGIC CIRCUITS;

BUILT IN SELF TEST (BIST); CELLULAR AUTOMATON; FINITE STATE MACHINE;

GENETIC ALGORITHMS;

EID: 0030422275     PISSN: 10636730     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)