Quality assurance and testing before, during, and after construction of semiconductor tracking detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 383, Issue 1, 1996, Pages 223-228

  Runolfsson, O ^a  

^a CERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ACCIDENT PREVENTION; HIGH ENERGY PHYSICS; MICROSTRIP DEVICES; PARTICLE BEAM TRACKING; QUALITY ASSURANCE; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DEVICES; SILICON SENSORS;

SEMICONDUCTOR TRACKING DETECTORS;

PARTICLE DETECTORS;

EID: 0030421939     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00618-3     Document Type: Article

References (14)

1. These Proceedings (2nd Int. Symp. on Development and Application of Semiconductor Tracking Detectors, Hiroshima, Japan, 1995) Nucl. Instr. and Meth. A 383 (1996) 1-266.
2. K. Ahmet et al., Nucl. Instr. and Meth. A 305 (1991) 275.
3. P.P. Allport et al., Nucl. Instr. and Meth. A 346 (1994) 476.
4. B.E. Anderson et al., IEEE Trans. Nucl. Sci. NS-41(4) (1994) 845.
5. Hughes model 2470 II, Hughes Aircraft Company, 2051 Palomar Airport Road, Carlsbad, CA 92009.
6. Aprova model HA55-W-1520-3/4 FM, Aprova Ltd, CH-3250 Lyss.
7. 1 Dr. Muller Feidraht AG, Schulstrasse 3, CH-8802 Kirchberg/Zurich.
8. Silicon glue Q1-9226, Dow Corning, 7180 Sneffe, Belgium.
9. Pull tester model HMP 2300, Hybrid Machine Corporation, 710 South 8th Street, Canton City, CO 81212.
10. Probe station Alessi model REL-3200, with microscope Bausch Lomb Microzoom, Magnification 22.5 to 500, Alessi Inc., 35 Parker, Irvine, CA 92718.
11. UVO cleaner, Model #144-220, Jelight Company Inc, California.
12. Technics Model 300 E, Technics Plasma GmbH, Diesel-strasse 22a, D-8011 Kirchheim bei Munich.
13. Compaclean I + C - Z, PBT AG, Gustav Mauer Strasse 25, CH-8702 Zollikon.
14. Zestron FA, Dr. O. Wack, Chemie GmbH, Bunsenstrasse 6, D-85053 Ingolstadt.