Diagnostic fault equivalence identification using redundancy information & structural analysis

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 294-302

  Hartanto, Ismed ^a   Boppana, Vamsi ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; ELECTRIC FAULT CURRENTS; NETWORKS (CIRCUITS);

DIAGNOSTIC FAULT EQUIVALENCE IDENTIFICATION; REDUNDANCY INFORMATION;

INTEGRATED CIRCUIT TESTING;

EID: 0030421841     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)