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Volumn 143, Issue 12, 1996, Pages 4095-4100
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Electrochemistry of chemical vapor deposited tungsten films with relevance to chemical mechanical polishing
a,c a,c a,c b,c |
Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL POLISHING;
CHEMICAL VAPOR DEPOSITION;
DISSOLUTION;
ELECTROCHEMISTRY;
HYDROGEN PEROXIDE;
OXIDATION;
PASSIVATION;
PH EFFECTS;
POLARIZATION;
TUNGSTEN;
X RAY PHOTOELECTRON SPECTROSCOPY;
CHEMICAL MECHANICAL POLISHING (CMP);
CHEMICAL VAPOR DEPOSITED TUNGSTEN FILMS;
DC POTENTIODYNAMIC POLARIZATION;
LINEAR POLARIZATION;
TAFEL METHODS;
SEMICONDUCTING FILMS;
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EID: 0030421764
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1837342 Document Type: Article |
Times cited : (72)
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References (11)
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