Nano material processing with lasers in combination with nearfield technology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2888, Issue , 1996, Pages 110-117

  Dickmann, Klaus ^a   Jersch, Johann ^a   Demming, Frank ^a   Hildenhagen, Jens ^a  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC MATERIALS; NANOSTRUCTURED MATERIALS; POLYCARBONATES; PROCESSING; RAMAN SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY;

NANOMATERIAL PROCESSING; NEARFIELD TECHNOLOGY; SURFACE ENHANCED RAMAN SPECTROSCOPY;

LASER BEAM EFFECTS;

EID: 0030421580     PISSN: 0277786X     EISSN: None     Source Type: None    
DOI: 10.1117/12.253100     Document Type: Conference Paper

References (13)