Grain orientation mapping and spatially resolved strain measurements for polycrystalline films by x-ray microdiffraction

Materials Research Society Symposium - Proceedings

Volumn 403, Issue , 1996, Pages 213-218

  Wang, P C ^a   Cargill, G S ^a   Noyan, I C ^a   Liniger, E G ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CAPILLARITY; CRYSTAL ORIENTATION; DETECTORS; STRAIN MEASUREMENT; SYNCHROTRONS; THERMAL STRESS; THIN FILMS; X RAY CRYSTALLOGRAPHY; X RAYS;

GRAIN ORIENTATION MAPPING; POLYCRYSTALLINE FILM; REAL SPACE MAPPING; RECIPROCAL SPACE MAPPING; X RAY MICRODIFFRACTION;

POLYCRYSTALLINE MATERIALS;

EID: 0030420917     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)