Enhanced performance of CdS/CdTe thin-film devices through temperature profiling techniques applied to close-spaced sublimation deposition

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1996, Pages 933-936

  Li, Xiaonan ^a   Sheldon, Pete ^a   Moutinho, Helio ^a   Matson, Richard ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; ELECTRIC VARIABLES MEASUREMENT; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SPECTRUM ANALYSIS; SUBLIMATION; SUBSTRATES; TEMPERATURE CONTROL; THIN FILM DEVICES;

CLOSED SPACED SUBLIMATION DEPOSITION; PHOTOVOLTAIC DEVICES; PINHOLES; TEMPERATURE PROFILING;

SOLAR CELLS;

EID: 0030420816     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)