Characterization of symmetry properties of patterns by generalized autocorrelation functions

Optics Communications

Volumn 132, Issue 5-6, 1996, Pages 593-605

  Neubecker, R ^a  

^a NONE   (Germany)

Author keywords

Image analysis; Pattern formation; Symmetry analysis

Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; EXPERIMENTS; IMAGE ANALYSIS;

AUTOCORRELATION FUNCTIONS; NONLINEAR OPTICAL FEEDBACK SYSTEMS; PATTERN FORMATION; SYMMETRY ANALYSIS;

NONLINEAR OPTICS;

EID: 0030420797     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(96)00404-X     Document Type: Article

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