Application of electron spin resonance as a tool for building in reliability (BIR)

Materials Research Society Symposium - Proceedings

Volumn 428, Issue , 1996, Pages 293-310

  Conley Jr , John F ^a  

^a DYNAMICS RESEARCH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PARAMAGNETIC RESONANCE; RELIABILITY; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DEVICE TESTING;

BUILDING IN RELIABILITY (BIR);

MOS DEVICES;

EID: 0030420056     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-428-293     Document Type: Conference Paper

References (74)