Use of a co-axial CT and planar bus to improve IGBT device characterization

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 3, Issue , 1996, Pages 1507-1516

  Braun, D ^a   Lukaszewski, R ^a   Pixler, D ^a   Skibinski, G ^a  

^a Allen Bradley Standard Drives Div   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; ELECTRIC CURRENT CONTROL; ELECTRIC GROUNDING; ELECTRIC IMPEDANCE; ELECTRIC TRANSFORMERS; POWER ELECTRONICS; POWER SUPPLY CIRCUITS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SWITCHING;

COAXIAL CURRENT TRANSFORMER; FIXTURE INSTRUMENTATION; INDUCTANCE; INSULATED GATE BIPOLAR TRANSISTORS; PLANAR BUS; SOFT SWITCHING; SWITCHING DEVICES; SWITCHING TIMES;

BIPOLAR TRANSISTORS;

EID: 0030419297     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)