Simulation of the triple junction effects in vacuum devices

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 2, Issue , 1996, Pages 562-566

  Damamme, G ^a   Le Gressus, C ^a  

^a Cent d'Electronique de   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRON TRANSPORT PROPERTIES; FLASHOVER; SURFACE DISCHARGES; TRANSPORT PROPERTIES;

SECONDARY ELECTRON CASCADE MODEL; TRIPLE JUNCTION EFFECTS;

ELECTRON TUBES;

EID: 0030419226     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)