X-ray diffraction analysis of thin clay films from dilute suspensions using glancing incidence diffraction

Clays and Clay Minerals

Volumn 44, Issue 6, 1996, Pages 811-817

  Ozalas, Katherine ^a   Hajek, Benjamin F ^b  

^a Eagan McAllister Associates   (United States)

^b AUBURN UNIVERSITY   (United States)

Author keywords

GID; Thin films; XRD

Indexed keywords

CLAY MINERALOGY; GLANCING INCIDENCE DIFFRACTION; SOIL CLAY; XRD;

EID: 0030418702     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/CCMN.1996.0440612     Document Type: Article

References (27)

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