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Volumn , Issue , 1996, Pages 461-464
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Porous silicon gettering
a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
COSTS;
CRYSTAL IMPURITIES;
DIFFUSION;
ETCHING;
FILM GROWTH;
OXIDATION;
PHOTONS;
SUBSTRATES;
SURFACES;
THIN FILMS;
EPITAXIAL SUBSTRATE;
POLYCRYSTALLINE SILICON THIN FILM GROWTH;
POROUS SILICON GETTERING;
SILICON WAFERS;
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EID: 0030418641
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/pvsc.1996.564043 Document Type: Conference Paper |
Times cited : (12)
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References (15)
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