Comparing topological, symbolic and GA-based ATPGs: An experimental approach

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 39-43

  Corno, F ^a   Prinetto, P ^a   Rebaudengo, M ^a   Reorda, M Sonza ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; ELECTRIC NETWORK TOPOLOGY; SEQUENTIAL CIRCUITS;

AUTOMATIC TEST PATTERN GENERATOR (ATPG);

INTEGRATED CIRCUIT TESTING;

EID: 0030416908     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)