MFBIST: A BIST method for random pattern resistant circuits

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 176-185

  AlShaibi, Mohammed F ^a   Kime, Charles R ^a  

^a Natl Information Cent   (Saudi Arabia)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT LAYOUT; SEQUENTIAL CIRCUITS; SHIFT REGISTERS;

BUILT IN SELF TEST (BIST); RANDOM PATTERN RESISTANT CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0030416907     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)