Characterization of zirconium-diamond interfaces

Materials Research Society Symposium - Proceedings

Volumn 423, Issue , 1996, Pages 143-148

  Baumann, P K ^a   Bozeman, S P ^a   Ward, B L ^a   Nemanich, R J ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION EFFECTS; DEPOSITION; DIAMONDS; ELECTRIC CURRENT MEASUREMENT; EMISSION SPECTROSCOPY; EVAPORATION; SURFACE CLEANING; SURFACE TREATMENT; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; VOLTAGE MEASUREMENT;

NEGATIVE ELECTRON AFFINITY (NEA); POSITIVE ELECTRON AFFINITY; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY (UPS);

INTERFACES (MATERIALS);

EID: 0030416898     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-423-143     Document Type: Conference Paper

References (33)