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Volumn 2, Issue , 1996, Pages 459-462
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Signature analysis of flash over voltage phenomena on contaminated insulator surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
CERAMIC MATERIALS;
CONTAMINATION;
ELECTRIC ARCS;
ELECTRIC CURRENTS;
FAST FOURIER TRANSFORMS;
FLASHOVER;
LEAKAGE CURRENTS;
OSCILLOGRAPHS;
SURFACE DISCHARGES;
FLASHOVER VOLTAGE (FOV) TESTING;
ELECTRIC INSULATORS;
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EID: 0030416776
PISSN: 00849162
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (4)
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