Time-dependent global-model simulation for a pseudospark discharge with a cylindrical hollow cathode

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 12 A, 1996, Pages 6252-6258

  Lee, Hae June ^a   Lee, Jae Koo ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Global model; Hollow cathode; Numerical simulation; Pseudospark discharge; Secondary electron emission

Indexed keywords

POWER FACTOR; PSEUDOSPARK DISCHARGE DEVICES; RECOMBINATION EFFECTS; TIME DEPENDENT GLOBAL MODEL SIMULATION;

ARGON; CATHODES; COMPUTER SIMULATION; CURRENT DENSITY; ELECTRIC BREAKDOWN OF GASES; ELECTRIC INSULATORS; ELECTRON BEAMS; ELECTRON DENSITY MEASUREMENT; ELECTRON EMISSION; IONS; PRESSURE EFFECTS; TEMPERATURE MEASUREMENT;

ELECTRIC SPARKS;

EID: 0030416738     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.6252     Document Type: Article

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