Determination of dielectric constant of dielectric particles using negative dielectrophoresis

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 1, Issue , 1996, Pages 241-244

  Lee, Sang Wook ^a   Kim, Yong Wook ^a   Kim, Yong Kweon ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRODES; ELECTROPHORESIS; PERMITTIVITY MEASUREMENT; POLARIZATION; REGRESSION ANALYSIS; STRUCTURE (COMPOSITION);

DIELECTRIC PARTICLES; ELECTRODE STRUCTURE; NEGATIVE DIELECTROPHORESIS; NONLINEAR REGRESSION METHOD;

DIELECTRIC MATERIALS;

EID: 0030416555     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)