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Volumn 2, Issue , 1996, Pages 539-
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Quantitative characterization of surface topography and its effect on corrosion and wear resistance of TiN thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
CORROSION RESISTANCE;
GRAIN SIZE AND SHAPE;
HARDNESS;
MATHEMATICAL MODELS;
PLASMA APPLICATIONS;
SCANNING ELECTRON MICROSCOPY;
SURFACE ROUGHNESS;
THIN FILMS;
TIN COMPOUNDS;
TITANIUM NITRIDE;
WEAR RESISTANCE;
PLASMA ASSISTED CHEMICAL VAPOR DEPOSITION;
SURFACE TOPOGRAPHY;
BIOMATERIALS;
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EID: 0030416412
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (5)
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