Combined socketed and non-socketed CDM test approach for eliminating real-world CDM failures

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1996, Pages 62-75

  Olney, Andrew ^a  

^a ANALOG DEVICES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; ELECTRIC BREAKDOWN OF SOLIDS; FAILURE ANALYSIS;

CHARGED DEVICE MODEL (CDM) CLASSIFICATION TESTING; DIELECTRIC BREAKDOWN FAILURE MECHANISMS;

INTEGRATED CIRCUIT TESTING;

EID: 0030415677     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)