Novel techniques for carrier lifetime measurement by Ψ-MOSFET transients

IEEE International SOI Conference

Volumn , Issue , 1996, Pages 160-161

  Cristoloveanu, S ^a   Elewa, T ^a   Munteanu, D ^a   Ionescu, A ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CRYSTAL DEFECTS; ELECTRIC CURRENTS; INTERFACES (MATERIALS); SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING; SILICON ON INSULATOR TECHNOLOGY;

CARRIER GENERATION LIFETIME; CHARGE BALANCE EQUATION; DRAIN CURRENT TRANSIENTS; WAFER SCREENING;

MOSFET DEVICES;

EID: 0030415295     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)