Dependence of cell performance on wafer thickness for BSF and non-BSF cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1996, Pages 505-507

  Koval, T ^a   Wohlgemuth, J ^a   Kinsey, B ^a  

^a Solarex Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ANTIREFLECTION COATINGS; DIFFUSION; EFFICIENCY; METALLIZING; PERFORMANCE; SEMICONDUCTOR DEVICE MANUFACTURE; SHORT CIRCUIT CURRENTS; SILICON SOLAR CELLS; TITANIUM DIOXIDE;

BACK SURFACE FIELD; CAST POLYCRYSTALLINE SILICON SOLAR CELLS; WAFER THICKNESS;

SILICON WAFERS;

EID: 0030415291     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/pvsc.1996.564054     Document Type: Conference Paper

References (6)